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Yokogawa Electric Corporation announces that it has developed the WG51S2 infrared sensor for the WEBFREX NV online thickness gauge. Positioned as an OpreX™ Quality Control System family solution, the WG51S2 infrared sensor enables the WEBFREX NV online thickness gauge to measure and control the thickness of films and sheets with greater accuracy than ever before. This new product will be released on September 3.

Thickness gauges are used on film and sheet production lines to measure and control film and sheet thickness. They ensure that all products coming off the line are of uniform thickness. Various kinds of plastic film have been developed for packaging, including highly functional film that can preserve the quality of packaged contents and film that can be printed with vivid colors to improve the attractiveness of the packaging. Environmental concerns have driven efforts to make plastic films recyclable and thinner, and so it is important to have thickness gauges that are capable of measuring the thickness of thin films with a high degree of accuracy. To satisfy this need, Yokogawa has developed this infrared sensor.

For the handling of various kinds of films and sheets, four different types of noncontact sensors are available for use with the WEBFREX NV online thickness gauge. These are a β-ray sensor that can measure a wide range of materials, an X-ray sensor that is suitable for measuring compositionally homogeneous films, an infrared sensor that is suitable for use with plastic films that absorb infrared light, and an optical sensor that is suitable for measuring multilayer films and other kinds of transparent films.

Features:
1. Maximum accuracy of ±0.1㎛
2. Designed for maintainability and compatibility

The Innovators’ Meeting honors Endress+Hauser employees for economically significant and especially creative innovations. Awards are also handed out for process improvements or the reuse of existing solutions. The 20th annual event, originally scheduled for 2020, was held this year while celebrating a new record in approved patents. More than 100 employees were recognized.

Since 2000 Endress+Hauser has invited all employees involved in patent filings to the annual Innovators’ Meeting. No in-person events were held in the past two years because of the coronavirus pandemic. The company thus used this year as an opportunity to celebrate the event’s 20th anniversary. 360 innovators were invited to attend the two-day session at Europa-Park in Rust, Germany to be creative and celebrate with one another.

National Instruments, the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, today announced a sub-6 GHz 5G test reference solution compliant with the 3GPP Release 15 specification for 5G New Radio (NR).

With commercial 5G NR deployments below 6 GHz on the horizon, engineers are actively developing sub-6 GHz 5G RF components and devices. The accelerated pace of 5G standardization is driving intense pressure to bring products to market quickly. NI’s sub-6 GHz 5G NR reference solution is a cost-effective and high-performance option for test that helps engineers quickly characterize their designs and more easily transition from R&D to production test environments.

The new reference test solution from NI is well-suited for testing new wideband RFICs, especially those operating in the 3.3 – 4.2 GHz and 4.4 – 5.0 GHz bands. Engineers can test devices operating with 400 MHz of continuous signal bandwidth and beyond with the PXIe-5840 Vector Signal Transceiver (VST), which includes 1 GHz of instantaneous signal generation and analysis bandwidth up to 6 GHz. With the NI VST, the solution delivers residual EVM performance better than 0.32 percent (-50 dB) for 100 MHz NR signals along with faster measurement speed.

“Our new offerings for 5G test are just the latest in a long line of NI innovations helping engineers bring 5G technologies to market more quickly,” said Jason White, director of RF and wireless test at NI. “By combining high-performance RF measurement capability with extremely fast and flexible measurement software, we are helping engineers reduce time-to-market and measurement correlation time by reusing the same instrumentation and measurement science in multiple phases of product development.”

NI’s new technology for 5G test also supplements a comprehensive product portfolio for RF and semiconductor test, including measurement software for 2G, 3G, LTE-Advanced Pro, WiFi 802.11ax, Bluetooth 5 and more. In addition, engineers can use the NI VST alongside more than 600 modular PXI products, spanning DC to mmWave, to create comprehensive semiconductor characterization and manufacturing test systems.